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Development and Testing of Rut Index,
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| Testing with the PPS-2000 has shown that a transverse scanner can produce full lane continuous transverse profiles which can be processed to generate multiple longitudinal profiles. The following is a sample of the results that show Longitudinal Profile bias performance of the initial tests which exceed ASTM E-950 Class I requirements. | ||||||||||||
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| A extensive report covering two test periods spanning 2 years associated with RPUG 1999 and 2000 is in early draft form. The goal was to be done by now, but production of the PPS-2001 and development of the RF-3000 must come first. You may down load the draft, but be aware that it will be updated periodically. An email distribution will annouse the final release. Please email to be notified of updates to the draft report. Feedback is welcomed! | ||||||||||||
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2.3 MB pdf |
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